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Technical Programme


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Please note: The technical programme starts daily at 09:30. This is an hour later than previous EAGE Conference & Exhibition events.
The technical programme is also included in the Programme & Catalogue, which can be downloaded here.


Overview by
= oral presentation  = poster presentation
History Matching and Uncertainty
TypeOral session
ChairmanT. Schaaf - Storengy
V. Gervais - IFP Energies Nouvelles

14:30We N117 09 Microseismic to Reservoir Simulation: How?
C.W. Neuhaus (MicroSeismic, Inc.), H. Shojaei (MicroSeismic, Inc.), A. Agharazi (MicroSeismic, Inc.), S. Kashikar (MicroSeismic, Inc.) & P.M. Duncan* (MicroSeismic, Inc.)
14:55We N117 10 An Efficient Approach to History Matching a Large Oilfield, a Successful Case Study
N. Dousi* (SGS) & P. Wojcik (SGS)
15:20We N117 11 Crossover Use of Ensemble Kalman Filter and Ensemble Smoother for Efficient History Matching
H. Jo (Seoul National University), J. An (Seoul National University), K. Lee (Korea Institute of Geoscience and Mineral Resource) & J. Choe* (Seoul National University)
15:45We N117 12 Multi-objective Geostistical History Matching
J.C. Carneiro (University of Lisbon - CERENA/IST), A.S. Amílcar Soares (Instituto Superior Técnico/Universidade de LIsboa) & L. Azevedo* (CERENA/IST - University of Lisbon)
16:10 Break
16:30We N117 13 Improved History Matching and Uncertainty Quantification for Gas Condensate Fields Using an Ensemble Based Approach
A. Barliansyah* (Bayerngas Norge AS), T. Skåre (Bayerngas Norge AS), T.F. Munck (Resoptima AS) & J. Sætrom (Resoptima AS)
16:55We N117 14 Uncertainty in Gross Rock Volume Analysis - A Stochastic or Deterministic Approach?
S.L. Meyer Viol* (Utrecht University) & H.L.J. Hoetz (EBN B.V.)
17:20We N117 15 Uncertainty Analysis and History Matching on Grid Responses from a Reduced-basis Approach
S. Da Veiga (IFPEN, now with SNECMA) & V. Gervais* (IFPEN)
17:45We N117 16 Incorporating Geology into Hardware Decisions - How Reservoir Uncertainty and Sensitivity Studies Lead to Better Hardware Selection
S. Walia* (Roxar) & G. Leahy (Emerson Process Management)